Scanning Electron Microscope
Overview: The scanning electron microscope uses the scatter from a focused beam of electrons impacting a target to produce an image of the sample to very high magnifications. This leads to some electronic charging of samples, which can lead to sample degeneration at high beam intensities. Both organic and non-organic samples may be imaged, provided they can withstand a low vacuum required to maintain an electron beam. Energy-dispersive X-ray spectroscopy is also possible with this instrument.